Feedback-controlled electromigration (FCE) is an experimental technique to investigate the phenomenon known as electromigration. By controlling the voltage applied as the conductance varies it is possible to keep the voltage at a critical level for electromigration.
FCE is often used in forming nanogaps in metallic bridges.
Problems
Thermal runaway can occur when the neck is narrower than about 20 nm.[5]
References and external links
^H.Ishida (September 2000). "Driving force for adatom electromigration within mixed Cu/Al overlayers on Al(111)". Journal of Applied Physics. 89 (9): 4809–4814. Bibcode:2001JAP....89.4809R. doi:10.1063/1.1325385.
^M.Mahadevan and R.m. Bradley (1999). "Simulations and theory of electromigration-induced slit formation in unpassivated single-crystal metal lines". Physical Review B. 59 (16): 11037–11046. Bibcode:1999PhRvB..5911037M. doi:10.1103/PhysRevB.59.11037.